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Movement of ions in an electrical field
Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting
Electromigration
Used in semiconductor integrated circuits
respectively, qualifying it as a good alternative to copper. Resistance to electromigration, the process by which a metal conductor changes shape under the influence
Copper_interconnects
Equation used to calculate the electromigration of ions in a fluid
total flux is composed of three elements: diffusion, advection, and electromigration. This implies that the concentration is affected by an ionic concentration
Nernst–Planck_equation
Models the mean time to failure of a semiconductor circuit due to electromigration
the mean time to failure (MTTF) of a semiconductor circuit due to electromigration: a phenomenon of molecular rearrangement (movement) in the solid phase
Black's_equation
Electronic experimental technique
Feedback-controlled electromigration (FCE) is an experimental technique to investigate the phenomenon known as electromigration. By controlling the voltage
Feedback-controlled electromigration
Feedback-controlled_electromigration
Measure of a substance's ability to resist or conduct electric current
original on 29 April 2017. Retrieved 28 April 2017. "Electromigration : What is electromigration?". Middle East Technical University. Retrieved 31 July
Electrical resistivity and conductivity
Electrical_resistivity_and_conductivity
Topics referred to by the same term
the range of all possible frequencies of electromagnetic radiation Electromigration, the transport of conducting solid material caused by electric current
EM
Technology to reprogram computer chips
work (blow) by electromigration, the phenomenon where electric flow causes the conductor material to move. Although electromigration is generally undesired
EFuse
Chemical used in metallurgy for cleaning or purifying molten metal
orders of magnitude lower than the bulk resistance of the material Electromigration and growth of whiskers between nearby traces, aided by ionic residues
Flux_(metallurgy)
devices in general long after it should (in theory) have vanished. Electromigration, which means to physically move the atom to new locations (to physically
Computer security compromised by hardware failure
Computer_security_compromised_by_hardware_failure
Ways electronic components fail and prevention measures
and circuit failure. Soldered joints can fail in many ways including electromigration and the formation of brittle intermetallic layers. Some failures show
Failure of electronic components
Failure_of_electronic_components
Process of silicon transistors developing flaws over time as they are used
main causes of transistor aging in MOSFETs are electromigration and charge trapping. Electromigration is the movement of ions caused by momentum from
Transistor_aging
thermal runaway. Nonhomogenous distribution of current also aggravates electromigration effects and the formation of voids (see, e.g., the Kirkendall effect)
Current_crowding
Central computer component that executes instructions
miniaturization of electronic gates is causing the effects of phenomena like electromigration and subthreshold leakage to become much more significant. These newer
Central_processing_unit
Amount of charge flowing through a unit cross-sectional area per unit time
material forming the interconnections actually moves, a phenomenon called electromigration. In superconductors excessive current density may generate a strong
Current_density
gallium nitride are virtually insensitive to this kind of defect. Electromigration: This is caused by high current density and can move atoms out of the
List_of_LED_failure_modes
IEEE and IEC standard
circuits. ALF can model behavior, timing, power and noise, hot electron, electromigration, antenna effects, physical abstraction and physical implementation
Advanced_Library_Format
Nanotube conductors for chip wiring
temperature. One of the unresolved challenges of electromigration are self-amplification effects of electromigration through self-heating at defects in interconnect
Carbon nanotubes in interconnects
Carbon_nanotubes_in_interconnects
Topics referred to by the same term
from spontaneous diffusion, including drift current, electrophoresis, electromigration, thermodiffusion, sedimentation, in physical chemistry and materials
Migration
Lienig, Jens; Rothe, Susann; Thiele, Matthias (2025). Fundamentals of electromigration-aware integrated circuit design (Second ed.). Cham, Switzerland: Springer
Diffusion_barrier
American engineer
introduced new failure mechanism models for electromigration and highlighted a practical model for electromigration and its relationship to microstructure
Aristos_Christou
Creating an integrated circuit by combining many transistors into a single chip
for manufacturing (DFM), design for test (DFT), and design for X. Electromigration Application-specific integrated circuit Caltech Cosmic Cube Interface
Very-large-scale_integration
Phenomenon in electrical devices
metal into a solution of metal ions, which are then redistributed by electromigration in the presence of an electromagnetic field. While the precise mechanism
Whisker_(metallurgy)
Manufacturing process used to create integrated circuits
such as self-heating of the transistors, and other effects, such as electromigration, have become more evident since the 16nm node. In 2011, Intel demonstrated
Semiconductor device fabrication
Semiconductor_device_fabrication
Electromagnetic effect in physics
many small charge carriers, typically electrons, holes, ions (see Electromigration) or all three. When a magnetic field is present, these charges experience
Hall_effect
American experimental rock and mineral physicist
Valpo Stories, Valparaiso University. Kohlstedt, David Lee (1970). Electromigration and chemical diffusion in titanium carbide (Thesis). doi:10.2172/4751961
David_Kohlstedt
Class of polymers
Chiou, Bi-Shiou (2001). "The effect of polyimide passivation on the electromigration of Cu multilayer interconnections". Journal of Materials Science: Materials
Polyimide
Chemical element with atomic number 86 (Rn)
experiments may have been due to the high concentration of fluoride used. Electromigration studies also suggest the presence of cationic [HRnO3]+ and anionic
Radon
Iron alloy optimized for magnetic properties
2019. Niazi, A.; Pieri, J. B.; Berger, E.; Jouty, R. (1975). "Note on electromigration of grain boundaries in silicon iron". Journal of Materials Science
Electrical_steel
Micro-electronic component
reliability, stress migration, decreased mean time between failures, electromigration, wire bonding, metastability and other performance degradation of the
System_on_a_chip
Type of solid state switch
carrier injection (HCI), time-dependent dielectric breakdown (TDDB), electromigration (ECM), solder fatigue, material reconstruction, corrosion. The overstress
Insulated-gate bipolar transistor
Insulated-gate_bipolar_transistor
Brand by Intel
known as Sudden Northwood Death Syndrome (SNDS), which was caused by electromigration. Also based on the Northwood core, the Mobile Intel Pentium 4 Processor
Pentium_4
Allotropes of carbon with a cylindrical nanostructure
Lienig J, Thiele M (2018). "Mitigating Electromigration in Physical Design". Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer
Carbon_nanotube
GPU for the PlayStation 3
rates, increasing mechanical fatigue in certain regions of the BGA. Electromigration within the solder joints led to the formation of voids, further weakening
RSX_Reality_Synthesizer
Chemical element with atomic number 100 (Fm)
E. K.; Baisden, T. A.; Näsäkkälä, Elina; Wahlberg, Olof (1981). "Electromigration Method in Tracer Studies of Complex Chemistry. II. Hydrated Radii and
Fermium
Designing products to facilitate manufacturing
expected lifespan. This involves analyzing how design choices impact electromigration, hot carrier injection, and other potential failure mechanisms, and
Design_for_manufacturability
Type of electronic circuit
simultaneous full current and voltage (although thermal stress and electromigration can shorten the MTBF), bipolar switches generally can't so require
DC-to-DC_converter
Chemical compound
chemical stability, as well as low resistivity (5.6 μΩ·cm) and very low electromigration. WF6 is favored over related compounds, such as WCl6 or WBr6, because
Tungsten_hexafluoride
American physicist (1910–1992)
could occur in a metallic state. He is also known for his work on the electromigration of atoms, which later became an important consideration in semiconductor
Hillard_Bell_Huntington
Electrical system design based on power distribution
current densities lead to undesirable wearing out of metal wires due to electromigration (EM). Therefore, the challenge in the design of a power distribution
Power_network_design_(IC)
Mechanical design approach
developed by James Black of Motorola to describe the behavior of electromigration. Electromigration occurs when collisions of electrons cause metal atoms in a
Physics_of_failure
Categorizing products by quality
procedure that has irreversible effects on the test sample including electromigration, which limits the duration of such testing. Similar to frequency binning
Product_binning
Austrian microelectronics scientist
2015, doi:10.1016/j.physrep.2015.05.002. H. Ceric, S. Selberherr. Electromigration in Submicron Interconnect Features of Integrated Circuits., Materials
Siegfried_Selberherr
Phenomenon in solid-state electronic devices
gate oxide breakdown (also time-dependent dielectric breakdown, TDDB) Electromigration (EM) Negative bias temperature instability (NBTI) Stress migration
Hot-carrier_injection
Nonlinear two-terminal fundamental circuit element
mechanisms, both extrinsic (redox reactions, charge trapping/detrapping and electromigration within the barrier) and intrinsic (spin-transfer torque). Based on
Memristor
Minimum electric current through a contact to break through the surface film resistance
radio wave detector Contact protection – Concept in switch design Electromigration – Movement of ions in an electrical field McMillan, Gregory K., ed
Wetting_current
Relations between flows and forces, or gradients, in thermodynamic systems
(thermophoresis) Thermal expansion Voltage Peltier effect Ohm's law Electromigration Piezoelectricity Chemical potential Dufour effect Galvanic cell Fick's
Onsager_reciprocal_relations
Power management technique of varying the voltage used by a component
various adverse device-level effects such as hot carrier injection and electromigration occur more rapidly at higher voltages, decreasing the lifespan of overvolted
Dynamic_voltage_scaling
Alloy used to join metal pieces
reliability weakening and brittleness, increased electrical resistance, or electromigration and formation of voids. The gold-tin intermetallics layer is responsible
Solder
Part of a telecommunications network
wiring utilized in some networks, as it may present issues caused by electromigration.This results in increased electrical resistance, reducing signal integrity
Access_network
Glass containing one or more of sulfur, selenium and tellurium
phase-change device. Diffusion of both electrons and ions participate in electromigration—widely studied as a degradation mechanism of the electrical conductors
Chalcogenide_glass
includes studies of gate oxide breakdown, hot-carrier degradation, and electromigration in advanced CMOS technologies. He has also investigated reliability
Joseph_B._Bernstein
Paper-like display technology
researchers. Switchable contrast in such displays is achieved by the electromigration of highly scattering or absorbing microparticles (in the size range
Electronic_paper
Differential diffusion
commonly referred to as "purple plague" and less often "white plague". Electromigration Smigelskas, A. D.; Kirkendall, E. O. (1947). "Zinc Diffusion in Alpha
Kirkendall_effect
Filtration method that uses nanometer sized pores in biological membranes
like in larger pore size filtration such as microfiltration), and 3) electromigration (attraction or repulsion from charges within and near the membrane)
Nanofiltration
Type of electrical contact to semiconductors
critical part of the technological development of any new semiconductor. Electromigration and delamination at contacts are also a limitation on the lifetime
Ohmic_contact
Pest control method
remediation of cadmium-contaminated soil. The solar cell could drive the electromigration of cadmium in contaminated soil, and the removal efficiency that was
Soil_solarization
Branch of nanotechnology
in which a thin electrode is stretched until it breaks. Another is electromigration. Here a current is led through a thin wire until it melts and the atoms
Molecular-scale_electronics
Chemical compound
of copper interconnects, where it serves to suppress diffusion and electromigration and serves as a diffusion barrier.[better source needed] Copper silicides
Copper_silicide
Integrated circuit composed of several vertically stacked chips
Technology. Retrieved 2014-05-15.[permanent dead link] "Factors Affecting Electromigration and Current Carrying Capacity of Flip Chip and 3D IC Interconnects"
Three-dimensional integrated circuit
Three-dimensional_integrated_circuit
the opposite direction. Electromigration also serves as the major component for ionic contaminant removal. For electromigration to occur absorbed material
Electrokinetic_remediation
GPU used in the Xbox 360
poor reliability and limited robustness against phenomena such as electromigration, resulting in the formation of microscopic voids within the conductive
Xenos_(graphics_chip)
Verification stages of electronic designs that must pass before manufacture
runtime makes it infeasible for full-chip analysis modern designs. Electromigration lifetime checks – To ensure a minimum lifetime of operation at the
Signoff (electronic design automation)
Signoff_(electronic_design_automation)
Structures that connect circuit elements in an integrated circuit
compatibility, junction spiking and reliability concerns (mostly concerning electromigration) forced the use of aluminum-based alloys containing silicon, copper
Interconnect (integrated circuits)
Interconnect_(integrated_circuits)
Austrian physicist
alloys, micro and nanomechanics of thin film materials, mechanisms of electromigration and degradation in miniaturized materials systems to the modeling of
Eduard_Arzt
Defect imaging technique class
monitoring the input current to the device. OBIRCH is useful for detecting electromigration effects resulting in open metal lines. A constant voltage is applied
Thermal_laser_stimulation
electrophoresis Strain, H. H.; Sullivan, J. C. (1951). "Analysis by Electromigration plus Chromatography". Analytical Chemistry. 23 (6): 816–823. doi:10
Electrochromatography
Topics referred to by the same term
Madagascar Feed conversion efficiency, in agriculture Feedback-controlled electromigration, a physics experiment Final consumption expenditure, in macroeconomics
FCE
Electronic device consisting of two wires
physically pulling the wires apart or through chemical etching or electromigration. As the wire breaks, the separation between the electrodes can be indirectly
Break_junction
Net transport of atoms through a solid
Lienig, Jens; Rothe, Susann; Thiele, Matthias (2025). Fundamentals of electromigration-aware integrated circuit design (2nd ed.). Cham, Switzerland: Springer
Atomic_diffusion
Form of insidious localized corrosion in which a pit develops at the anode site
creates a gradient of electrical potential and is responsible for the electromigration of aggressive anions into the pit. For example, when a metal is exposed
Pitting_corrosion
Topics referred to by the same term
Circulation of Blood" in 1825 James R. Black (scientist), researcher in electromigration and for whom Black's equation is named James F. Black (1919–1988),
James_Black
Engineering process for electronic hardware
to discrete components, where such concerns are less of an issue. Electromigration in metallic interconnect and ESD damage to the tiny components are
Integrated_circuit_design
Electromagnetism Electromanipulation Electromechanical coupling coefficient Electromigration Electromotive force Electron Electron-capture dissociation Electron-cloud
Index_of_physics_articles_(E)
Approximation used in electrical circuits
thinner wire sections introduced by tapering increase the risk of electromigration, which may lead to physical wire damage and long-term reliability issues
Elmore_delay
MOSFET that can handle significant power levels
internal components such as bond wires, and other phenomena such as electromigration in the metal layer. The junction temperature (TJ) of the MOSFET must
Power_MOSFET
Chemical compound
magnolol and honokiol, purification has often been limited to a HPLC or electromigration. However, methods developed in 2006 by workers in the lab of Jack L
Honokiol
Materials whose temperature variance leads to voltage change
investigated the cracking failure of Cu pillar bump that was caused by electromigration under thermoelectric coupling load. They showed that under thermoelectric
Thermoelectric_materials
Quality of robustness of computer hardware
error and are typically due to some physical failure such as metal electromigration or dielectric breakdown. Temporary faults include transient and intermittent
Reliability, availability and serviceability
Reliability,_availability_and_serviceability
Patterns of low tree density in northern Canada
Zn-Pb-Cu Deposit, Queensland, Australia: Evidence of Redox-Induced Electromigration". Special Publication. 2 (15). Society of Economic Geologists: 391–398
Forest_ring
Any chemical compound having at least one radon atom in its structure
experiments may have been due to the high concentration of fluoride used. Electromigration studies also suggest the presence of cationic [HRnO3]+ and anionic
Radon_compounds
Chemical compound
Tesarová, E.; Deyl, Z. (28 September 1998). Advanced Chromatographic and Electromigration Methods in BioSciences. Elsevier. p. 345. ISBN 978-0-08-085868-5. Retrieved
Obtusilic_acid
Lienig, M. Thiele (2018). "Mitigating Electromigration in Physical Design". Fundamentals of Electromigration-Aware Integrated Circuit Design. Springer
Potential applications of carbon nanotubes
Potential_applications_of_carbon_nanotubes
Novel computer memory type
density must be sufficiently high to push the domain walls (as in electromigration). A difficulty for racetrack technology arises from the need for high
Racetrack_memory
Analytical chemistry technique
the sample solution and molecules are loaded to the CE capillary by electromigration and electroosmotic flow of the sample. Electrokinetic injection improves
Capillary electrophoresis–mass spectrometry
Capillary_electrophoresis–mass_spectrometry
contamination—impurities in packaging compounds cause electrical failure Electromigration – electrically induced movement of the materials in the chip Burnout
Reliability_(semiconductor)
Key reliability issue in MOSFETs
layouts to control circuit behavior over time. Hot carrier injection Electromigration S. Entner, “Time Exponent in Power-Law Modeling of NBTI”, TU Wien,
Negative-bias temperature instability
Negative-bias_temperature_instability
Czech scientist and Holocaust survivor (1927–2024)
as gas chromatography, high-performance liquid chromatography and electromigration. At the same time, she attended an analytical conference in Prague
Eva_Smolková-Keulemansová
electronics. Additionally, copper wire exhibits internal failure by electromigration at high current density, limiting miniaturization of wire. Copper's
Potential applications of graphene
Potential_applications_of_graphene
Electrical device
and current densities above 105 A/cm2 the metallization undergoes electromigration and forms spikes through the junction, shorting it out; this process
Antifuse
American chemical engineer (1920–2015)
thermodynamics applied to metallurgy, nucleation, thermomigration, electromigration, impact adhesion, and hydrogen embrittlement of steel. In 1980 he retired
Richard_Oriani
Software used in integrated circuit design
important specs such as device resistance and sources of problems such as electromigration or too thin wires resulting in burn up of wires causing shorts or open
IC_layout_editor
detection through a formulary approach in accordance with the theory of electromigration. Using the intermolecular interactions between molecules occurring
Affinity_electrophoresis
Estonian chemist (born 1945)
research award in chemistry and molecular biology for the research cycle Electromigration methods in the analysis of bioprocesses. In 2009 he received the Order
Mihkel_Kaljurand
doping. The time constant of the heaters lies between 5 μs to 100 μs. Electromigration limits the longterm sustainable heater temperature to 700–800 °C. The
Thermal scanning probe lithography
Thermal_scanning_probe_lithography
Reverse osmosis transport model
the ion flux ( v i {\displaystyle v_{i}} ) governed by diffusion, electromigration, and advection can be expressed as: v i = K w , i v w − K w , i D i
Solution-friction_model
or excessive flexure, lead fatigue, wire bond fatigue, via fatigue, electromigration, time dependent dielectric breakdown, hot-carrier injection, and negative
Sherlock Automated Design Analysis
Sherlock_Automated_Design_Analysis
reaction – August Bischler and Bernard Napieralski Black's equation for electromigration – James R. Black (d. 2004) of Motorola Blandford–Znajek process – Roger
Scientific phenomena named after people
Scientific_phenomena_named_after_people
American statistician
research fellowship at NIST to develop better statistical models for electromigration failures of microcircuits. Nelson, Wayne (December 2003). Applied Life
Wayne_Nelson_(statistician)
possibility of contaminants playing a major role. The possibility of electromigration, where the electrons move atomic impurities via momentum transfer due
Carbon_nanotube_nanomotor
ELECTROMIGRATION
ELECTROMIGRATION
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Breath.
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Owns a new house.
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A Sharp Sword
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Belonging of Lord Shiv, Whose owner is Lord Shiv, Lord Shiv in female form. Goddess Parvati
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Title for Mogul. Means same as Sayyad.
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Gujarati, Hindu, Indian, Jain, Kannada, Telugu
Target; Mission; Aim
ELECTROMIGRATION
ELECTROMIGRATION
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