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DIMENSIONAL METROLOGY

  • Dimensional metrology
  • Specialization

    Dimensional metrology, also known as industrial metrology, is the application of metrology for quantifying the physical size, form (shape), characteristics

    Dimensional metrology

    Dimensional_metrology

  • Metrology
  • Science of measurement and its application

    Metrology is the scientific study of measurement. It establishes a common understanding of units, crucial in linking human activities. Modern metrology

    Metrology

    Metrology

    Metrology

  • Nova Ltd.
  • Semiconductor company based in Israel

    advanced metrology solutions for semiconductor manufacturing. Founded in 1993, the company specializes in dimensional, materials, and chemical metrology technologies

    Nova Ltd.

    Nova_Ltd.

  • Quantum metrology
  • Application of quantum entanglement to high-precision measurement

    of freedom. Quantum metrological gain Dimensional metrology Forensic metrology Smart Metrology Time metrology Braunstein, Samuel L.; Caves, Carlton M

    Quantum metrology

    Quantum_metrology

  • Forensic metrology
  • Science of measurement applied to forensics

    Forensic metrology is a branch of metrology (the science of measurements) applied to forensic sciences. Metrology has evolved various techniques for assessing

    Forensic metrology

    Forensic_metrology

  • Outline of metrology and measurement
  • Topical index of English Wikipedia articles about metrology and measurement

    topic of metrology and measurement. Metrology is the science of measurement and its application. Metrology Measurement Dimensional metrology Forensic

    Outline of metrology and measurement

    Outline_of_metrology_and_measurement

  • Dimensional analysis
  • Analysis of the dimensions of different physical quantities

    sides, a property known as dimensional homogeneity. Checking for dimensional homogeneity is a common application of dimensional analysis, serving as a plausibility

    Dimensional analysis

    Dimensional_analysis

  • Unit of measurement
  • Quantity standard

    therefore about 25% too small. Dimensional metrology Forensic metrology Smart Metrology Time metrology Quantum metrology GNU Units List of humorous units

    Unit of measurement

    Unit of measurement

    Unit_of_measurement

  • Advanced product quality planning
  • Framework of procedures and techniques in product development

    (PPAP) Zhao, Yaoyao (2011). Information modeling for interoperable dimensional metrology. Springer. p. 301. ISBN 9781447121664. Retrieved June 12, 2015.

    Advanced product quality planning

    Advanced_product_quality_planning

  • Jenoptik
  • German integrated photonics group

    separating, and drilling of solar cells for three-dimensional processing of metals Industrial Metrology: Measuring devices and machines for roughness measurement

    Jenoptik

    Jenoptik

    Jenoptik

  • Smart Metrology
  • Approach to industrial metrology

    control systems. Dimensional metrology Forensic metrology Quantum metrology Time metrology Pou, Jean-Michel. (2016). La smart metrology : de la métrologie

    Smart Metrology

    Smart_Metrology

  • DMIS
  • Topics referred to by the same term

    Intercultural Sensitivity, or Bennett scale Dimensional Measuring Interface Standard, in dimensional metrology Doha Modern Indian School, in Qatar Doctor

    DMIS

    DMIS

  • Frequency comb
  • Laser source with equal intervals of spectral lines

    European Southern Observatory. 22 May 2015. Optical frequency comb for dimensional metrology, atomic and molecular spectroscopy, and precise time keeping Archived

    Frequency comb

    Frequency comb

    Frequency_comb

  • Steinhart–Hart equation
  • Semiconductor resistance model

    Matus, Michael (October 2011). Temperature Measurement in Dimensional Metrology – Why the Steinhart–Hart Equation works so well (PDF). MacroScale

    Steinhart–Hart equation

    Steinhart–Hart_equation

  • National Institute of Standards and Technology
  • Measurement standards laboratory in the United States

    be found on the NIST website. Dimensional metrology Forensic metrology Quantum metrology Smart Metrology Time metrology AD-X2 Advanced Encryption Standard

    National Institute of Standards and Technology

    National_Institute_of_Standards_and_Technology

  • Interferometry
  • Measurement method using interference of waves

    technique in the fields of astronomy, fiber optics, engineering, metrology, optical metrology, oceanography, seismology, spectroscopy (and its applications

    Interferometry

    Interferometry

    Interferometry

  • History of timekeeping devices
  • clocks and time (UTC) Dimensional metrology – SpecializationPages displaying short descriptions with no spaces Forensic metrology – Science of measurement

    History of timekeeping devices

    History of timekeeping devices

    History_of_timekeeping_devices

  • Resonator
  • Device or system that exhibits resonance

    resonance of the fiber. One application is as a measurement device for dimensional metrology. The most familiar examples of acoustic resonators are in musical

    Resonator

    Resonator

    Resonator

  • Positioning system
  • Technology for determining an object's location in space

    scanning Assisted GPS Coordinate-measuring machine Dynamic positioning Dimensional metrology Eye tracking Geodesy Geolocation Handheld tracker Indoor positioning

    Positioning system

    Positioning_system

  • Joint Committee for Guides in Metrology
  • The Joint Committee for Guides in Metrology (JCGM) is an organization in Sèvres that prepared the Guide to the Expression of Uncertainty in Measurement

    Joint Committee for Guides in Metrology

    Joint_Committee_for_Guides_in_Metrology

  • List of obsolete units of measurement
  • system of volume measurement Dimensional metrology Forensic metrology Smart Metrology Time metrology Quantum metrology Hair's breadth Hindu units of

    List of obsolete units of measurement

    List_of_obsolete_units_of_measurement

  • Historical metrology
  • Study of measurement systems

    scientific units of the modern world. Dimensional metrology Forensic metrology Smart Metrology Time metrology Quantum metrology World Weights and Measures: Handbook

    Historical metrology

    Historical_metrology

  • Thermistor
  • Type of resistor whose resistance varies with temperature

    ISSN 1573-482X. Matus, Michael (2011). "Temperature measurement in dimensional metrology - Why the Steinhart-Hart equation works so well" (PDF). MacroScale

    Thermistor

    Thermistor

    Thermistor

  • Standing wave
  • Wave that remains in a constant position

    Standing waves can also occur in two- or three-dimensional resonators. With standing waves on two-dimensional membranes such as drumheads, illustrated in

    Standing wave

    Standing wave

    Standing_wave

  • Calibration
  • Check on the accuracy of measurement devices

    In measurement technology and metrology, calibration is the comparison of measurement values delivered by a device under test with those of a calibration

    Calibration

    Calibration

  • Coordinate Metrology Society
  • Organization of coordinate metrologists

    model a British cannon recovered from the Battle of Yorktown. Metrology Dimensional metrology Quality control National Institute of Standards and Technology

    Coordinate Metrology Society

    Coordinate_Metrology_Society

  • TSOM
  • target in a distinct way, which is very well applicable in nanoscale dimensional metrology. The TSOM method is alleged to have several nanometrology applications

    TSOM

    TSOM

  • Square (tool)
  • Handtools for marking and checking 90° and 45° angles

    OCLC 875304703. Dotson, Connie (January 2015). Fundamentals of dimensional metrology (Sixth ed.). Australia: Cengage Learning. p. 320. ISBN 978-1-133-60089-3

    Square (tool)

    Square (tool)

    Square_(tool)

  • Timeline of temperature and pressure measurement technology
  • Ruben invented the thermistor Dimensional metrology Forensic metrology Smart Metrology Time metrology Quantum metrology History of thermodynamic temperature

    Timeline of temperature and pressure measurement technology

    Timeline_of_temperature_and_pressure_measurement_technology

  • Surface metrology
  • Measurement of small-scale features on surfaces

    Surface metrology is the measurement and characterization of surface topography, and is a branch of metrology. Surface primary form, surface fractality

    Surface metrology

    Surface_metrology

  • Coordinate-measuring machine
  • Device for measuring the geometry of objects

    Hansen H.N.; Carneiro K.; Haitjema H.; De Chiffre L. (2006). "Dimensional Micro and Nano Metrology". Cirp Annals. 55 (2). CIRP Annals, 55-2, 721–743: 721–743

    Coordinate-measuring machine

    Coordinate-measuring machine

    Coordinate-measuring_machine

  • Length measurement
  • Ways in which length, distance or range can be measured

    electron beams. Measurement techniques for three-dimensional structures very small in every dimension use specialized instruments such as ion microscopy

    Length measurement

    Length_measurement

  • International System of Quantities
  • System of quantities used in science and their interrelationships

    {N}}^{f}{\mathsf {J}}^{g}} ⁠, where the dimensional exponents are positive, negative, or zero. The dimension symbol may be omitted if its exponent is

    International System of Quantities

    International System of Quantities

    International_System_of_Quantities

  • National Institute of Astrophysics, Optics and Electronics
  • Science research institute located in Tonantzintla, Puebla, Mexico

    and Digital Color Optical Instrumentation Optical Microscopy and Dimensional Metrology Diffractive Optics Biomedical Optics Thin-films University of California

    National Institute of Astrophysics, Optics and Electronics

    National Institute of Astrophysics, Optics and Electronics

    National_Institute_of_Astrophysics,_Optics_and_Electronics

  • JCMsuite
  • Simulation software

    Its applications in research and development projects include dimensional metrology systems, photolithographic systems, photonic crystal fibers, VCSELs

    JCMsuite

    JCMsuite

    JCMsuite

  • Virtual metrology
  • v t e In semiconductor manufacturing, virtual metrology refers to methods to predict the properties of a wafer based on machine parameters and sensor

    Virtual metrology

    Virtual_metrology

  • Real versus nominal value (metrology)
  • Philosophical distinctions

    distinction between real value and nominal value occurs in many fields. In metrology, the nominal value of a physical quantity is a rounded or approximate

    Real versus nominal value (metrology)

    Real_versus_nominal_value_(metrology)

  • Combination square
  • Measuring and marking tool

    Fundamentals of Dimensional Metrology. Cengage Learning. pp. 100–106. ISBN 978-1305177741. Raghavendra, N. V. (2013). Engineering metrology and measurements

    Combination square

    Combination square

    Combination_square

  • SI base unit
  • One of the seven units of measurement that define the metric system

    luminous intensity. The SI base units are a fundamental part of modern metrology, and thus part of the foundation of modern science and technology. The

    SI base unit

    SI base unit

    SI_base_unit

  • NCSL International
  • Global non-profit organization focused on metrology

    focus from automatic test and calibration systems to chemical and dimensional metrology; from deadweight pressure gauges to the triple point of argon. Industrial

    NCSL International

    NCSL_International

  • Dimensionless quantity
  • Quantity with no physical dimension

    Similitude (model) "1.8 (1.6) quantity of dimension one dimensionless quantity". International vocabulary of metrology – Basic and general concepts and associated

    Dimensionless quantity

    Dimensionless_quantity

  • Photo response non-uniformity
  • Noise in digital sensors

    picture has been heavily post-processed and manipulated. High-end and metrology camera vendors tend to characterize this non-uniformity during instrument

    Photo response non-uniformity

    Photo_response_non-uniformity

  • Quotient
  • Mathematical result of division

    6+{\tfrac {2}{3}}=6.66...} (a repeating decimal) in the second sense. In metrology (International System of Quantities and the International System of Units)

    Quotient

    Quotient

    Quotient

  • Precision measurement equipment laboratory
  • equipment takes place. This practice is also known as metrology: the science of measurement. Metrology is defined as the science of weights & measures, while

    Precision measurement equipment laboratory

    Precision_measurement_equipment_laboratory

  • National Physical Laboratory (United Kingdom)
  • National measurement institution of the UK

    standards for British industry. Founded in 1900, the NPL is one of the oldest metrology institutes in the world. Research and development work at the laboratory

    National Physical Laboratory (United Kingdom)

    National Physical Laboratory (United Kingdom)

    National_Physical_Laboratory_(United_Kingdom)

  • Surface roughness
  • Measure of surface finish or texture

    interpretations and definitions depending on the disciplines considered. In surface metrology, surface roughness is a component of surface finish (surface texture)

    Surface roughness

    Surface roughness

    Surface_roughness

  • List of measuring instruments
  • Device for measuring a physical quantity

    List of physical quantities List of sensors List of tools and equipment Metrology Pocket comparator Sensor or detector Timeline of temperature and pressure

    List of measuring instruments

    List of measuring instruments

    List_of_measuring_instruments

  • VIEW Engineering
  • "About VIEW Micro-Metrology". VIEW Micro-Metrology. Retrieved 7 July 2011. "VIEW Micro-Metrology Applications". VIEW Micro-Metrology. Retrieved 7 July

    VIEW Engineering

    VIEW_Engineering

  • First article inspection
  • Design verification process

    by an approved subcontract supplier such as a dimensional inspection/metrology laboratory. Dimensional characteristics (size, shape, and feature location)

    First article inspection

    First_article_inspection

  • Micrometer (device)
  • Tool for the precise measurement of a component's length, width, and/or depth

    used in mechanical engineering, machining, metrology and most mechanical trades, along with other dimensional instruments such as dial, vernier, and digital

    Micrometer (device)

    Micrometer (device)

    Micrometer_(device)

  • International System of Units
  • Modern form of the metric system

    "quantity", "unit", "dimension", etc. that are used in the SI Brochure are those given in the international vocabulary of metrology. The brochure leaves

    International System of Units

    International System of Units

    International_System_of_Units

  • Industrial computed tomography
  • Computer-aided tomographic process

    for industrial CT scanning have been flaw detection, failure analysis, metrology, assembly analysis and reverse engineering applications. Just as in medical

    Industrial computed tomography

    Industrial computed tomography

    Industrial_computed_tomography

  • Computational microscopy
  • Algorithmic imaging methods that reconstruct quantitative phase and amplitude

    X-ray tomography and laminography provide non-destructive three-dimensional metrology of advanced integrated circuits, resolving nanoscale structures

    Computational microscopy

    Computational microscopy

    Computational_microscopy

  • David Icke
  • English conspiracy theorist (born 1952)

    planet, although just as fourth-dimensional reptilians control us, they, in turn, are controlled by a fifth dimension. Michael Barkun argues that Icke's

    David Icke

    David Icke

    David_Icke

  • Touch probe
  • Device for measuring the geometry of objects

    Touch probes are tools used for precision measurements in CNC (Computer Numerical Control) machining processes. They work in a way similar to Coordinate-measuring

    Touch probe

    Touch_probe

  • Dimensioners
  • Dimensioners are weighing and volume measuring systems for measuring three-dimensional or cuboid-shaped objects such as packages, parcels, pallets, cartons

    Dimensioners

    Dimensioners

  • Airy points
  • Support points minimising bending of beams

    points (after George Biddell Airy) are used for precision measurement (metrology) to support a length standard in such a way as to minimise bending or

    Airy points

    Airy_points

  • Serial time-encoded amplified microscopy
  • Optical imaging method

    dynamics.[citation needed] The three-dimensional version is useful for range detection,[citation needed] dimensional metrology,[citation needed] and surface

    Serial time-encoded amplified microscopy

    Serial_time-encoded_amplified_microscopy

  • TU Braunschweig
  • University in Germany

    well as ubiquitous sensors and standards. The focus is on the metrology of 3-dimensional Nano systems. At the Automotive Research Centre Niedersachsen

    TU Braunschweig

    TU Braunschweig

    TU_Braunschweig

  • Graphene
  • Hexagonal lattice made of carbon atoms

    Xu, Yang; Gao, Chao; Xianfeng, Duan (2016). "Three-dimensional macro-structures of two-dimensional nanomaterials". Chemical Society Reviews. 45 (20):

    Graphene

    Graphene

    Graphene

  • Seconds pendulum
  • Pendulum whose period is precisely two seconds

    \pi ^{2}}} where g is the acceleration due to gravity, with quantity dimension of length per time squared. Using the standard acceleration of gravity

    Seconds pendulum

    Seconds pendulum

    Seconds_pendulum

  • Measurement uncertainty
  • Factor of lower probability in measurement

    In metrology, measurement uncertainty is the expression of the statistical dispersion of the values attributed to a quantity measured on an interval or

    Measurement uncertainty

    Measurement_uncertainty

  • Mitutoyo
  • Japanese multinational manufacturer of measuring instruments

    metrological science. When the computer made its way into the field of metrology, Mitutoyo again shifted its focus to include this technology into its

    Mitutoyo

    Mitutoyo

    Mitutoyo

  • Nanometrology
  • Metrology of nanomaterials

    Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level. Nanometrology has a crucial role in order

    Nanometrology

    Nanometrology

    Nanometrology

  • Probe tip
  • Instrument used to physically scan the surface of a sample

    Theodore V (1999). "Dimensional metrology with the NIST calibrated atomic force microscope". In Singh, Bhanwar (ed.). Metrology, Inspection, and Process

    Probe tip

    Probe_tip

  • Design for verification
  • within the sphere of digital to physical dimensional verification and on how to successfully achieve dimensional specifications within real-world assembly

    Design for verification

    Design_for_verification

  • Physikalisch-Technische Bundesanstalt
  • National metrology institute of the German Federal Republic

    Braunschweig) with the following departments: Surface Metrology, Dimensional Nanometrology, Coordinate Metrology, Interferometry on Material Measures, Scientific

    Physikalisch-Technische Bundesanstalt

    Physikalisch-Technische Bundesanstalt

    Physikalisch-Technische_Bundesanstalt

  • Physical constant
  • Universal and unchanging physical quantity

    elementary charge e. Physical constants can take many dimensional forms: the speed of light has dimension of length divided by time (T−1L), while the proton-to-electron

    Physical constant

    Physical_constant

  • IRENE (technology)
  • Digital imaging technology

    The Weavers. By 2005, Haber and Fadeyev had developed two-dimensional and three-dimensional machines, capable of recovering audio from vertically-cut

    IRENE (technology)

    IRENE_(technology)

  • Differential Hall Effect Metrology
  • Electrical depth profiling technique

    Differential Hall Effect Metrology (DHEM) is an electrical depth profiling technique that measures all critical electrical parameters (resistivity, mobility

    Differential Hall Effect Metrology

    Differential Hall Effect Metrology

    Differential_Hall_Effect_Metrology

  • Brown & Sharpe
  • Swedish machine tool builder

    gears. Since being acquired by Hexagon Metrology in 2001, Brown and Sharpe has concentrated exclusively on metrology equipment. Brown & Sharpe was founded

    Brown & Sharpe

    Brown_&_Sharpe

  • Ohm
  • SI derived unit of electrical resistance

    analyzed. Artifact standards are still used, but metrology experiments relating accurately dimensioned inductors and capacitors provided a more fundamental

    Ohm

    Ohm

    Ohm

  • Quantum error correction
  • Process in quantum computing

    with its environment. Quantum error correction can be applied to quantum metrology. Thus, a logical qubit is stored in several physical qubits. In the case

    Quantum error correction

    Quantum_error_correction

  • Attractor
  • Limiting set in dynamical systems

    finite-dimensional systems, the evolving variable may be represented algebraically as an n-dimensional vector. The attractor is a region in n-dimensional space

    Attractor

    Attractor

    Attractor

  • Streak camera
  • Instrument for measuring variation in light pulse intensity over time

    but 2-dimensional version of a camera mapping time into a spatial dimension Femto-photography Horn, Alexander (2009). Ultra-fast Material Metrology. John

    Streak camera

    Streak camera

    Streak_camera

  • Planck constant
  • Physical constant in quantum mechanics

    to the advancement of Physics by his discovery of energy quanta". In metrology, the Planck constant is used, together with other constants, to define

    Planck constant

    Planck_constant

  • Microextrusion
  • De Chiffre, L.; Weckenmann, A. (2011). "Computed tomography for dimensional metrology". CIRP Annals. 60 (2): 821–842. doi:10.1016/j.cirp.2011.05.006.

    Microextrusion

    Microextrusion

  • Ellipsometry
  • Optical technique for characterizing thin films

    ellipsometry setup for optical nanoform metrology". EPJ Web of Conferences. 238: 06006. Duwe, M. (2019). "Thin-film metrology of tilted and curved surfaces by

    Ellipsometry

    Ellipsometry

    Ellipsometry

  • Dmitri Mendeleev
  • Russian chemist (1834–1907)

    Petersburg his name was given to D. I. Mendeleev Institute for Metrology, the National Metrology Institute, dealing with establishing and supporting national

    Dmitri Mendeleev

    Dmitri Mendeleev

    Dmitri_Mendeleev

  • Malta Standards Authority
  • Maltese government agency

    consists of two divisions. The Legal Metrology Division is responsible for inspection and verification. The National Metrology Institute (MSA-NMS) is responsible

    Malta Standards Authority

    Malta_Standards_Authority

  • Flatness (manufacturing)
  • Geometric condition for workpieces and tools

    deviation root-mean-square flatness deviation The two-dimensional measures above find one-dimensional counterparts in straightness measures, defined by ISO

    Flatness (manufacturing)

    Flatness_(manufacturing)

  • Mononuclidic element
  • Related to Periodic Table

    only 11 of the mononuclidic elements are used in standard atomic weight metrology. These are aluminium, bismuth, caesium, cobalt, gold, manganese, phosphorus

    Mononuclidic element

    Mononuclidic element

    Mononuclidic_element

  • Semiconductor device fabrication
  • Manufacturing process used to create integrated circuits

    processing has increased the demand for metrology in between the various processing steps. For example, thin film metrology based on ellipsometry or reflectometry

    Semiconductor device fabrication

    Semiconductor device fabrication

    Semiconductor_device_fabrication

  • Digital holography
  • Imaging technique

    the ill-posed inverse problem of recovering three-dimensional information from a single two-dimensional hologram. Introduced by Brady et al. in 2009, the

    Digital holography

    Digital_holography

  • Autocollimator
  • Optical instrument for non-contact measurement of angles

    measurements to a resolution of 0.01 arcseconds. Recent developments in optical metrology have extended the role of the autocollimator beyond single-axis angular

    Autocollimator

    Autocollimator

    Autocollimator

  • Roundness
  • Measure of how closely the shape of an object approaches that of a circle

    _{i}}-{\hat {b}}\sin {\theta _{i}}} Roundness measurement is very important in metrology. It includes measurement of a collection of points. For this two fundamental

    Roundness

    Roundness

  • Fiducial marker
  • Reference point inserted in an image

    serve to moor the coordinates of the augmented content to the three dimensional location, orientation and scale of the open book, helping to create a

    Fiducial marker

    Fiducial marker

    Fiducial_marker

  • Carl Zeiss SMT
  • Semiconductor company

    include, among others, three-dimensional X-ray analysis, multi-beam electron beam inspection, and FIB-SEM-based three-dimensional imaging techniques. These

    Carl Zeiss SMT

    Carl Zeiss SMT

    Carl_Zeiss_SMT

  • Profilometer
  • Measuring instrument for surface profile and roughness

    improving their efficiency and durability. Road profilometery Surface metrology Jean M. Bennett, Lars Mattsson, Introduction to Surface Roughness and

    Profilometer

    Profilometer

    Profilometer

  • Quantum Fisher information
  • Quantum

    The quantum Fisher information is a central quantity in quantum metrology and is the quantum analogue of the classical Fisher information. It is one of

    Quantum Fisher information

    Quantum_Fisher_information

  • Size
  • Magnitude or dimension of a thing

    Represented in the Mind (2012), p. 108. de Silva, G.M.S. (2002), Basic Metrology for ISO 9000 Certification, Butterworth-Heinemann See, e.g., Robert A

    Size

    Size

    Size

  • Kilogram-force
  • Weight on earth of a one-kilogram mass

    the 9.80665 N of 1 kgf. The gram-force is 1⁄1000 of a kilogram-force. Metrology Avoirdupois NIST Guide to the SI, Chapter 5: Units Outside the SI The

    Kilogram-force

    Kilogram-force

  • Titanium dioxide nanoparticle
  • Nanomaterial

    these organisms, the soil composition would suffer. ISO/TS 11937 is a metrology standard for measuring several characteristics of dry titanium dioxide

    Titanium dioxide nanoparticle

    Titanium dioxide nanoparticle

    Titanium_dioxide_nanoparticle

  • Aṅgula
  • Indian unit of measurement

    settlements upon this tradition. — R. Balasubramanian New Insights on metrology during Maurya period In the Hindu Āgamas, the size of an aṅgula is considerably

    Aṅgula

    Aṅgula

  • Voronoi diagram
  • Type of plane partition

    Descartes in 1644. Peter Gustav Lejeune Dirichlet used two-dimensional and three-dimensional Voronoi diagrams in his study of quadratic forms in 1850.

    Voronoi diagram

    Voronoi diagram

    Voronoi_diagram

  • Russia
  • Country in Eastern Europe and North Asia

    Retrieved 23 November 2021. Vincent, J.R. Vincent (1981). "The Parliamentary Dimension of the Crimean War". Transactions of the Royal Historical Society. 31

    Russia

    Russia

    Russia

  • Surface finish
  • Small, local deviations of a surface from a perfectly flat ideal

    that are dimensionally precise create surfaces with low roughness. In other words, if a process can manufacture parts to a narrow dimensional tolerance

    Surface finish

    Surface_finish

  • Structured-light 3D scanner
  • Sensor that can create 3D scans using visible light

    A structured-light 3D scanner is a device used to capture the three-dimensional shape of an object by projecting light patterns, such as grids or stripes

    Structured-light 3D scanner

    Structured-light_3D_scanner

  • Time
  • Continuous progression from past to future

    linear continuum of instants and is a distinguished one-dimensional sub-space of four-dimensional spacetime. "Dictionary.com Unabridged, based on Random

    Time

    Time

    Time

  • Unified Code for Units of Measure
  • System of codes for unambiguously representing measurement units

    terms of the UCUM base units. Outline of metrology and measurement GNU Units International vocabulary of metrology Withdrawn without replacement. Superseded

    Unified Code for Units of Measure

    Unified_Code_for_Units_of_Measure

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Online names & meanings

  • Nijay
  • Boy/Male

    Hindu, Indian

    Nijay

    Victor

  • Antra
  • Girl/Female

    Australian, Gujarati, Hindu, Indian, Kannada

    Antra

    The Second Note in Hindustani Classical Music

  • Zauhu
  • Boy/Male

    Arabic, Muslim

    Zauhu

    God

  • Safaa |
  • Girl/Female

    Muslim

    Safaa |

    Purity, Clarity, Serenity

  • Snehith
  • Boy/Male

    Hindu

    Snehith

    A friend, Be friendly

  • Nizanth
  • Boy/Male

    Hindu

    Nizanth

  • Shed
  • Surname or Lastname

    English

    Shed

    English : variant of Shedd.

  • MANFREDO
  • Male

    Italian

    MANFREDO

    Italian form of Latin Manfredus, MANFREDO means "strong peace."

  • Gianveer
  • Boy/Male

    Sikh

    Gianveer

    Brave and divine in knowledge

  • Dhruvam
  • Boy/Male

    Hindu

    Dhruvam

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DIMENSIONAL METROLOGY

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DIMENSIONAL METROLOGY

  • Admeasure
  • v. t.

    The measure of a thing; dimensions; size.

  • Pelvimeter
  • n.

    An instrument for measuring the dimensions of the pelvis.

  • Dimensionless
  • a.

    Without dimensions; having no appreciable or noteworthy extent.

  • Dimension
  • n.

    Measure in a single line, as length, breadth, height, thickness, or circumference; extension; measurement; -- usually, in the plural, measure in length and breadth, or in length, breadth, and thickness; extent; size; as, the dimensions of a room, or of a ship; the dimensions of a farm, of a kingdom.

  • Dimensity
  • n.

    Dimension.

  • Scantling
  • v. t.

    The dimensions of a piece of timber with regard to its breadth and thickness; hence, the measure or dimensions of anything.

  • Mastodontic
  • a.

    Pertaining to, or resembling, a mastodon; as, mastodontic dimensions.

  • Dimensive
  • a.

    Without dimensions; marking dimensions or the limits.

  • Tridimensional
  • a.

    Having three dimensions; extended in three different directions.

  • Dimensional
  • a.

    Pertaining to dimension.

  • Hyperspace
  • n.

    An imagined space having more than three dimensions.

  • Dimension
  • n.

    The manifoldness with which the fundamental units of time, length, and mass are involved in determining the units of other physical quantities.

  • Trine
  • a.

    Threefold; triple; as, trine dimensions, or length, breadth, and thickness.

  • Unidimensional
  • a.

    Having but one dimension. See Dimension.

  • Assize
  • n.

    Measure; dimension; size.

  • Dimension
  • n.

    The degree of manifoldness of a quantity; as, time is quantity having one dimension; volume has three dimensions, relative to extension.

  • Gauge
  • n.

    Measure; dimensions; estimate.

  • Dimension
  • n.

    A literal factor, as numbered in characterizing a term. The term dimensions forms with the cardinal numbers a phrase equivalent to degree with the ordinal; thus, a2b2c is a term of five dimensions, or of the fifth degree.

  • Dimensioned
  • a.

    Having dimensions.

  • Dimension
  • n.

    Extent; reach; scope; importance; as, a project of large dimensions.