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CBED

Convergent beam electron diffraction

(CBED) is an electron diffraction technique where a convergent or divergent beam (conical electron beam) of electrons is used to study materials. CBED

4D scanning transmission electron microscopy

pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal

Electron microscope

conical illumination and is called convergent beam electron diffraction (CBED). This is good for determining the symmetry of materials. A third is precession

Electron diffraction

higher-level refinements of the electron density; for a brief history see CBED history. In many cases this is the best method to determine symmetry. The

Selected area diffraction

In the case of convergent beam, a convergent beam electron diffraction (CBED) is achieved. The beam used in SAD is broad illuminating a wide sample area

Scanning transmission electron microscopy

above). CBED differs from conventional electron diffraction in that CBED patterns consist of diffraction disks, rather than spots. The width of CBED disks

Dispersion relation

higher-order Laue zone (HOLZ) lines in convergent beam electron diffraction (CBED) patterns allows one, in effect, to directly image cross-sections of a crystal's

Austenitic stainless steel

Convergent beam electron diffraction (CBED) transmission electron micrograph of a [111] zone axis of austenitic stainless steel

Transmission electron microscopy

within the crystalline lattice. In convergent beam electron diffraction (CBED) where a non-parallel, i.e. converging, electron wavefront is produced by

CrysTBox

V.; Jäger, A. (2015). "Automated CBED processing: Sample thickness estimation based on analysis of zone-axis CBED pattern". Ultramicroscopy. 150. Elsevier